Introduction

The purpose of this page is to show how our proprietary test flow guarantees higher quality memory products with better reliability for industrial applications.

We will review the test flow process and show why Insignis grade memory has a longer product lifetime compared to standard grade memory.

 

The Insignis test flow selects the die with the lowest defect density to give our customers the best quality and reliability product possible.  We have a sophisticated algorithm that screens out die with defects and failure modes that are more likely to fail than the rest of the distribution.  The good die on each wafer are further sorted into Insignis grade product and then standard grade product.

 

This graph shows the standard distribution of die on a wafer versus the defect density for each die. Every DRAM die requires repair in order to make it a passing die. The number of repairs and the location of the repairs are direct indicators for the defect density for each die.

 

Yield, quality and reliability all trend directly with defect density. For the Insignis flow, we screen out the population of parts that have the lower yield and worse quality and reliability.